"Generative Adversarial Network-Based Fault Detection in Semiconductor ..."

Jeong Eun Choi et al. (2023)

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DOI: 10.3390/S23041889

access: open

type: Journal Article

metadata version: 2023-03-28

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Jeong Eun Choi, Da Hoon Seol, Chan Young Kim, Sang Jeen Hong:
Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data. Sensors 23(4): 1889 (2023)

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