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Dongil Kim
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2020 – today
- 2024
- [i4]Wonkeun Jo, Dongil Kim:
NFCL: Simply interpretable neural networks for a short-term multivariate forecasting. CoRR abs/2405.13393 (2024) - [i3]Hyungtaik Oh, Wonkeun Jo, Dongil Kim:
Attention-based sequential recommendation system using multimodal data. CoRR abs/2405.17959 (2024) - 2023
- [j17]Wonkeun Jo, Dongil Kim:
Neural additive time-series models: Explainable deep learning for multivariate time-series prediction. Expert Syst. Appl. 228: 120307 (2023) - [j16]Soomin Lee, Wonkeun Jo, Hyein Kim, Jeongin Koo, Dongil Kim:
Deep learning-based cutting force prediction for machining process using monitoring data. Pattern Anal. Appl. 26(3): 1013-1025 (2023) - 2022
- [j15]Wonkeun Jo, Dongil Kim:
OBGAN: Minority oversampling near borderline with generative adversarial networks. Expert Syst. Appl. 197: 116694 (2022) - [j14]Jinyoung Choi, Soomin Lee, Seonyoung Kim, Dongil Kim, Hyungshin Kim:
Depressed Mood Prediction of Elderly People with a Wearable Band. Sensors 22(11): 4174 (2022) - [c11]Heechang Chung, Dongil Kim, Sokpal Cho:
A Study on the Service model of risk mitigation on livestock pandemic based on Networks. ICACT 2022: 62-65 - [c10]Heechang Chung, Dongil Kim, Sokpal Cho:
A Study on the Cultivation Plan Service at the Preliminary production phase based on bigdata analysis. ICACT 2022: 226-229 - [i2]Wonkeun Jo, Dongil Kim:
Neural Additive Models for Nowcasting. CoRR abs/2205.10020 (2022) - 2021
- [c9]Heechang Chung, Dongil Kim, Sokpal Cho:
A Study on the Cultivation Plan Service at the Preliminary production phase based on bigdata analysis. ICACT 2021: 226-229 - 2020
- [j13]Dongil Kim, Seokho Kang, Sungzoon Cho:
Expected margin-based pattern selection for support vector machines. Expert Syst. Appl. 139 (2020) - [c8]Heechang Chung, Dongil Kim, Kyoung-Sook Jung, Byeong-Beom Kang, Sokpal Cho, Soonghee Lee:
Study on Service model of the Agriculture Information based Convergence Service. ICACT 2020: 139-141
2010 – 2019
- 2019
- [j12]Seokho Kang, Dongil Kim, Sungzoon Cho:
Approximate training of one-class support vector machines using expected margin. Comput. Ind. Eng. 130: 772-778 (2019) - [j11]Dongil Kim, Jeongin Koo, Hyein Kim, Seokho Kang, Sang-Hyun Lee, Jeong-Tae Kang:
Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis. Int. J. Distributed Sens. Networks 15(2) (2019) - [c7]Heechang Chung, Dongil Kim, Soonghee Lee, Sokpal Cho:
Smart Farming Education Service based on u-learning environment. ICACT 2019: 471-474 - [c6]Eun Jeong Choi, Eunjung Lim, Minjung Kwak, Miri Jeong, Nayoung Lee, Il Bum Kwon, Wonpyo Lee, Hanwool Ku, Dongil Kim, Haesung Nam, Junsik Na, Myonghwa Park:
Development of ICT-Based Comprehensive Health and Social-Needs Assessment System to Enhance Person-Centered Community Care. MedInfo 2019: 1694-1695 - [c5]Nayoung Lee, Minjung Kwak, Miri Jeong, Eun Jeong Choi, Eunjung Lim, Il Bum Kwon, Wonpyo Lee, Hanwool Ku, Dongil Kim, Haesung Nam, Junsik Na, Myonghwa Park:
Pilot Testing of an ICT-Based Care Management Support System to Deliver Integrated Community Care. MedInfo 2019: 1821-1822 - [i1]Doyup Lee, Suehun Jung, Yeongjae Cheon, Dongil Kim, Seungil You:
Demand Forecasting from Spatiotemporal Data with Graph Networks and Temporal-Guided Embedding. CoRR abs/1905.10709 (2019) - 2016
- [j10]Dongil Kim, JeeEun Karin Nam, JungSu Oh, Min Chul Kang:
A latent profile analysis of the interplay between PC and smartphone in problematic internet use. Comput. Hum. Behav. 56: 360-368 (2016) - [j9]Pilsung Kang, Dongil Kim, Sungzoon Cho:
Semi-supervised support vector regression based on self-training with label uncertainty: An application to virtual metrology in semiconductor manufacturing. Expert Syst. Appl. 51: 85-106 (2016) - 2015
- [j8]Dongil Kim, Pilsung Kang, Seung-kyung Lee, Seokho Kang, Seungyong Doh, Sungzoon Cho:
Improvement of virtual metrology performance by removing metrology noises in a training dataset. Pattern Anal. Appl. 18(1): 173-189 (2015) - 2014
- [j7]Pilsung Kang, Dongil Kim, Sungzoon Cho:
Evaluating the reliability level of virtual metrology results for flexible process control: a novelty detection-based approach. Pattern Anal. Appl. 17(4): 863-881 (2014) - 2012
- [j6]Dongil Kim, Pilsung Kang, Sungzoon Cho, Hyoungjoo Lee, Seungyong Doh:
Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing. Expert Syst. Appl. 39(4): 4075-4083 (2012) - [j5]Dongil Kim, Sungzoon Cho:
Pattern selection for support vector regression based response modeling. Expert Syst. Appl. 39(10): 8975-8985 (2012) - 2011
- [j4]Pilsung Kang, Dongil Kim, Hyoungjoo Lee, Seungyong Doh, Sungzoon Cho:
Virtual metrology for run-to-run control in semiconductor manufacturing. Expert Syst. Appl. 38(3): 2508-2522 (2011) - 2010
- [j3]Dongil Kim, Eunsam Kim, Choonhwa Lee:
Efficient peer-to-peer overlay networks for mobile IPTV services. IEEE Trans. Consumer Electron. 56(4): 2303-2309 (2010)
2000 – 2009
- 2009
- [j2]Pilsung Kang, Hyoungjoo Lee, Sungzoon Cho, Dongil Kim, Jinwoo Park, Chan-Kyoo Park, Seungyong Doh:
A virtual metrology system for semiconductor manufacturing. Expert Syst. Appl. 36(10): 12554-12561 (2009) - 2008
- [j1]Dongil Kim, Hyoungjoo Lee, Sungzoon Cho:
Response modeling with support vector regression. Expert Syst. Appl. 34(2): 1102-1108 (2008) - [c4]Dongil Kim, Sungzoon Cho:
Bootstrap Based Pattern Selection for Support Vector Regression. PAKDD 2008: 608-615 - 2007
- [c3]Youngjoo Lee, Joon Beom Seo, Bokyoung Kang, Dongil Kim, June-Goo Lee, Song Soo Kim, Namkug Kim, Suk-Ho Kang:
Performance comparison of classifiers for differentiation among obstructive lung diseases based on features of texture analysis at HRCT. Medical Imaging: Image Processing 2007: 651249 - 2006
- [c2]Dongil Kim, Sungzoon Cho:
epsilon-Tube Based Pattern Selection for Support Vector Machines. PAKDD 2006: 215-224 - 2004
- [c1]Meixun Jin, Mi-Young Kim, Dongil Kim, Jong-Hyeok Lee:
Segmentation of Chinese Long Sentences Using Commas. SIGHAN@ACL 2004
Coauthor Index
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last updated on 2024-06-24 21:03 CEST by the dblp team
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