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Seungyong Doh

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2010 – 2019

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2015
[j4]
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  - journals/paa/KimKLKDC15
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  - https://dblp.org/rec/journals/paa/KimKLKDC15
Dongil Kim, Pilsung Kang, Seung-kyung Lee, Seokho Kang, Seungyong Doh, Sungzoon Cho:
Improvement of virtual metrology performance by removing metrology noises in a training dataset. Pattern Anal. Appl. 18(1): 173-189 (2015)
2012
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Dongil Kim, Pilsung Kang, Sungzoon Cho, Hyoungjoo Lee, Seungyong Doh:
Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing. Expert Syst. Appl. 39(4): 4075-4083 (2012)
2011
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Pilsung Kang, Dongil Kim, Hyoungjoo Lee, Seungyong Doh, Sungzoon Cho:
Virtual metrology for run-to-run control in semiconductor manufacturing. Expert Syst. Appl. 38(3): 2508-2522 (2011)

2000 – 2009

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2009
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Pilsung Kang, Hyoungjoo Lee, Sungzoon Cho, Dongil Kim, Jinwoo Park, Chan-Kyoo Park, Seungyong Doh:
A virtual metrology system for semiconductor manufacturing. Expert Syst. Appl. 36(10): 12554-12561 (2009)

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