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Shizunori Matsumoto
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2010 – 2019
- 2018
- [j2]Atsushi Nose, Tomohiro Yamazaki, Hironobu Katayama, Shuji Uehara, Masatsugu Kobayashi, Sayaka Shida, Masaki Odahara, Kenichi Takamiya, Shizunori Matsumoto, Leo Miyashita, Yoshihiro Watanabe, Takashi Izawa, Yoshinori Muramatsu, Yoshikazu Nitta, Masatoshi Ishikawa:
Design and Performance of a 1 ms High-Speed Vision Chip with 3D-Stacked 140 GOPS Column-Parallel PEs. Sensors 18(5): 1313 (2018) - 2017
- [c3]Tomohiro Yamazaki, Hironobu Katayama, Shuji Uehara, Atsushi Nose, Masatsugu Kobayashi, Sayaka Shida, Masaki Odahara, Kenichi Takamiya, Yasuaki Hisamatsu, Shizunori Matsumoto, Leo Miyashita, Yoshihiro Watanabe, Takashi Izawa, Yoshinori Muramatsu, Masatoshi Ishikawa:
4.9 A 1ms high-speed vision chip with 3D-stacked 140GOPS column-parallel PEs for spatio-temporal image processing. ISSCC 2017: 82-83
2000 – 2009
- 2005
- [j1]Shizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama:
1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Trans. Electron. 88-C(2): 247-254 (2005) - 2001
- [c2]D. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama:
Correlation method of circuit-performance and technology fluctuations for improved design reliability. ASP-DAC 2001: 39-44 - [c1]Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Y. Tatsumi, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Terufumi Yamaguchi, Kyoji Yamashita, Noriaki Nakayama:
Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability. CICC 2001: 357-360
Coauthor Index
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