"Test-circuit-based extraction of inter- and intra-chip MOSFET-performance ..."

Shizunori Matsumoto et al. (2001)

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DOI: 10.1109/CICC.2001.929801

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type: Conference or Workshop Paper

metadata version: 2022-10-10

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Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Y. Tatsumi, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Terufumi Yamaguchi, Kyoji Yamashita, Noriaki Nakayama:
Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability. CICC 2001: 357-360

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