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2020 – today
- 2023
[j11]Lei Wang
, Xiaoxian Liu, Yunfei En, Zhangming Zhu:
A Composite Probe Capable of Simultaneously Measuring Two Orthogonal Magnetic-Fields. IEEE Trans. Circuits Syst. II Express Briefs 70(2): 521-525 (2023)- 2022
- [j10]Lei Wang, Yunfei En, Zhangming Zhu:
An Ultrawideband Multicomponent Differential Magnetic Probe for Near-Field Scanning. IEEE Trans. Circuits Syst. II Express Briefs 69(11): 4323-4328 (2022) - 2021
- [j9]Chao Peng, Rui Gao, Zhifeng Lei, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang:
Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs. IEEE Access 9: 22587-22594 (2021) - [j8]Chenbing Qu, Zhangming Zhu, Yunfei En, Liwei Wang, Xiaoxian Liu:
Area-Efficient Extended 3-D Inductor Based on TSV Technology for RF Applications. IEEE Trans. Very Large Scale Integr. Syst. 29(2): 287-296 (2021) - 2020
- [j7]Lei Wang, Wenxiao Fang, Wei-Heng Shao, Bin Yao, Yun Huang, Yunfei En:
Broadband Circularly Polarized Cross-Dipole Antenna With Multiple Modes. IEEE Access 8: 66489-66494 (2020) - [j6]Chao Peng, Zhifeng Lei, Rui Gao, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang:
Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET. IEEE Access 8: 99037-99046 (2020) - [c6]Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang:
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. IRPS 2020: 1-5
2010 – 2019
- 2019
- [j5]Lei Wang, Wenxiao Fang, Yunfei En, Yun Huang, Wei-Heng Shao, Bin Yao:
Wideband Circularly Polarized Cross-Dipole Antenna With Parasitic Elements. IEEE Access 7: 35097-35102 (2019) - [c5]Yueyang Liu, Xiangwei Jiang, Liwei Wang, Yunfei En, Runsheng Wang:
Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack. IRPS 2019: 1-4 - [c4]Xiaolei Ma, Xiangwei Jiang, Jiezhi Chen, Liwei Wang, Yunfei En:
Scaling Behaviour of State-to-State Coupling During Hole Trapping at Si/SiO2. IRPS 2019: 1-4 - 2018
- [j4]Si Chen, Zhizhe Wang, Yunfei En, Yun Huang, Fei Qin, Tong An:
The experimental analysis and the mechanical model for the debonding failure of TSV-Cu/Si interface. Microelectron. Reliab. 91: 52-66 (2018) - 2017
- [j3]Chao Peng, Yunfei En, Zhengxuan Zhang, Yuan Liu, Zhifeng Lei:
Radiation induced transconductance overshoot in the 130 nm partially-depleted SOI MOSFETs. Microelectron. Reliab. 75: 135-141 (2017) - [j2]Haimi Qiu, Wenxiao Fang, Yunfei En, Yun Huang, Yuan Liu, Ping Lai, Yiqiang Chen, Chunlei Shi:
Movable Noncontact RF Current Measurement on a PCB Trace. IEEE Trans. Instrum. Meas. 66(9): 2464-2473 (2017) - [c3]Dengyun Lei, Liwei Wang, Jun Lin, Yunfei En:
Quality Evaluation of Digital Soft IP Core for FPGA System. QRS Companion 2017: 583-584 - 2015
- [c2]Chunhua He, Bo Hou, Liwei Wang, Yunfei En, Shaofeng Xie:
A failure physics model for hardware Trojan detection based on frequency spectrum analysis. IRPS 2015: 1 - 2010
- [j1]Jie Liu, Jicheng Zhou, Hongwei Luo, Xuedong Kong, Yunfei En, Qian Shi, Yujuan He:
Total-dose-induced edge effect in SOI NMOS transistors with different layouts. Microelectron. Reliab. 50(1): 45-47 (2010)
2000 – 2009
- 2008
- [c1]Yunfei En, Yujuan He, Hongwei Luo, Qian Shi, Xianjun Kuang, Zhijian Pan:
The irradiation effect of DC-DC power converter under X-ray. APCCAS 2008: 1537-1541
Coauthor Index
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