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"A fast and test-proven methodology of assessing RTN/fluctuation on deeply ..."
Rui Gao et al. (2020)
- Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang:
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. IRPS 2020: 1-5
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