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ORCIDErich Gornik
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- affiliation: Vienna University of Technology, Faculty of Electrical Engineering and Information Technology, Austria
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Journal Articles
- 2011
[j17]Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik
:
Application of transient interferometric mapping method for ESD and latch-up analysis. Microelectron. Reliab. 51(9-11): 1592-1596 (2011)- 2010
- [j16]A. Podgaynaya, Ralf Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, Marc Strasser:
Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. Microelectron. Reliab. 50(9-11): 1347-1351 (2010) - 2009
- [j15]Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany:
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectron. Reliab. 49(9-11): 1346-1351 (2009) - [j14]Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler:
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. Microelectron. Reliab. 49(12): 1455-1464 (2009) - 2007
- [j13]Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler:
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. Microelectron. Reliab. 47(9-11): 1539-1544 (2007) - 2006
- [j12]Michael Heer, Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz:
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. Microelectron. Reliab. 46(9-11): 1591-1596 (2006) - 2005
- [j11]Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectron. Reliab. 45(9-11): 1688-1693 (2005) - [j10]Martin Litzenberger, Christoph Furböck, Sergey Bychikhin, Dionyz Pogany, Erich Gornik:
Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices. IEEE Trans. Instrum. Meas. 54(6): 2438-2445 (2005) - 2004
- [j9]Sergey Bychikhin, Viktor Dubec, Dionyz Pogany, Erich Gornik, M. Graf, V. Dudek, Winfried Soppa:
Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress. Microelectron. Reliab. 44(9-11): 1687-1692 (2004) - [j8]Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik:
Multiple-time-instant 2D thermal mapping during a single ESD event. Microelectron. Reliab. 44(9-11): 1793-1798 (2004) - 2003
- [j7]M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher:
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectron. Reliab. 43(4): 545-548 (2003) - [j6]Viktor Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, Ning Qu, Wolfgang Wilkening, L. Zullino, A. Andreini:
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. Microelectron. Reliab. 43(9-11): 1557-1561 (2003) - 2002
- [j5]Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik:
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectron. Reliab. 42(9-11): 1267-1274 (2002) - [j4]M. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, Erich Gornik:
Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. Microelectron. Reliab. 42(9-11): 1281-1286 (2002) - [j3]Dionyz Pogany, Ján Kuzmík, J. Darmo, Martin Litzenberger, Sergey Bychikhin, Karl Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, Erich Gornik:
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique. Microelectron. Reliab. 42(9-11): 1673-1677 (2002) - 2001
- [j2]Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner:
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectron. Reliab. 41(9-10): 1385-1390 (2001) - [j1]Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher:
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectron. Reliab. 41(9-10): 1501-1506 (2001)
Coauthor Index
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