"Automated setup for thermal imaging and electrical degradation study of ..."

Michael Heer et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.082

access: closed

type: Journal Article

metadata version: 2022-03-16

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Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectron. Reliab. 45(9-11): 1688-1693 (2005)

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