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ORCIDMatthias Stecher
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2010 – 2019
- 2015
[c1]Julie Paye, Albert Claudi, Matthias Stecher:
High voltage robustness of mold compounds under different environmental conditions. IRPS 2015: 5- 2011
- [j10]Martin Sauter, Werner Simbürger, David Johnsson, Matthias Stecher:
On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP). Microelectron. Reliab. 51(8): 1309-1314 (2011) - 2010
- [j9]A. Podgaynaya, Ralf Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik
, Matthias Stecher, Marc Strasser:
Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. Microelectron. Reliab. 50(9-11): 1347-1351 (2010) - [j8]Harald Gossner, Werner Simbürger, Matthias Stecher:
System ESD robustness by co-design of on-chip and on-board protection measures. Microelectron. Reliab. 50(9-11): 1359-1366 (2010)
2000 – 2009
- 2009
- [j7]Kaspar M. B. Jansen, C. Qian, Leo J. Ernst, C. Bohm, A. Kessler, Harald Preu, Matthias Stecher:
Modeling and characterization of molding compound properties during cure. Microelectron. Reliab. 49(8): 872-876 (2009) - [j6]Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany:
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectron. Reliab. 49(9-11): 1346-1351 (2009) - 2005
- [j5]Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectron. Reliab. 45(9-11): 1688-1693 (2005) - 2004
- [j4]Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik:
Multiple-time-instant 2D thermal mapping during a single ESD event. Microelectron. Reliab. 44(9-11): 1793-1798 (2004) - 2003
- [j3]M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher:
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectron. Reliab. 43(4): 545-548 (2003) - 2001
- [j2]Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher:
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. Microelectron. Reliab. 41(3): 385-393 (2001) - [j1]Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher:
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectron. Reliab. 41(9-10): 1501-1506 (2001)
Coauthor Index
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