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2010 – 2019
- 2017
[j11]R. Ruffilli, Mounira Berkani
, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros:
Mechanisms of power module source metal degradation during electro-thermal aging. Microelectron. Reliab. 76-77: 507-511 (2017)- 2015
- [j10]R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros:
In-depth investigation of metallization aging in power MOSFETs. Microelectron. Reliab. 55(9-10): 1966-1970 (2015) - 2014
- [j9]Michele Riccio, Vincenzo d'Alessandro, Andrea Irace, Gilles Rostaing, Mounira Berkani, Stéphane Lefebvre, Philippe Dupuy:
3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions. Microelectron. Reliab. 54(9-10): 1845-1850 (2014) - [j8]Donatien Martineau, Colette Levade, Marc Legros, Philippe Dupuy, Thomas Mazeaud:
Universal mechanisms of Al metallization ageing in power MOSFET devices. Microelectron. Reliab. 54(11): 2432-2439 (2014) - 2013
- [j7]Gilles Rostaing, Mounira Berkani, D. Mechouche, Denis Labrousse, Stéphane Lefebvre, Zoubir Khatir, Philippe Dupuy:
Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications. Microelectron. Reliab. 53(9-11): 1703-1706 (2013) - 2011
- [j6]Toufik Azoui, Patrick Tounsi, Philippe Dupuy, L. Guillot, Jean-Marie Dorkel:
3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs. Microelectron. Reliab. 51(9-11): 1943-1947 (2011) - 2010
- [j5]Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade:
Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. Microelectron. Reliab. 50(9-11): 1768-1772 (2010)
2000 – 2009
- 2009
- [j4]Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade, G. Vanderschaeve:
Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. Microelectron. Reliab. 49(9-11): 1330-1333 (2009) - 2007
- [j3]B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid:
Characterization and modelling of ageing failures on power MOSFET devices. Microelectron. Reliab. 47(9-11): 1735-1740 (2007) - 2005
- [j2]B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin:
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectron. Reliab. 45(9-11): 1717-1722 (2005) - 2001
- [j1]Gerard Coquery, S. Carubelli, Jean-Pierre Ousten, Richard Lallemand, Frederic Lecoq, Dominique Lhotellier, V. de Viry, Philippe Dupuy:
Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter. Microelectron. Reliab. 41(9-10): 1695-1700 (2001)
Coauthor Index
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