"Characterization of ageing failures on power MOSFET devices by electron ..."

Donatien Martineau et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.011

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type: Journal Article

metadata version: 2023-03-21

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Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade, G. Vanderschaeve:
Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. Microelectron. Reliab. 49(9-11): 1330-1333 (2009)

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