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Arun Krishnamachary

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2010 – 2019

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2010
[c6]
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Suriyaprakash Natarajan, Arun Krishnamachary, Eli Chiprout, Rajesh Galivanche:
Path coverage based functional test generation for processor marginality validation. ITC 2010: 544-552

2000 – 2009

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2008
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Kip Killpack, Suriyaprakash Natarajan, Arun Krishnamachary, Pouria Bastani:
Case Study on Speed Failure Causes in a Microprocessor. IEEE Des. Test Comput. 25(3): 224-230 (2008)
2003
[c5]
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Arun Krishnamachary, Jacob A. Abraham:
Effects of Multi-cycle Sensitization on Delay Tests. VLSI Design 2003: 137-142
2002
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Jacob A. Abraham, Arun Krishnamachary, Raghuram S. Tupuri:
A Comprehensive Fault Model for Deep Submicron Digital Circuits. DELTA 2002: 360-364
[c3]
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Arun Krishnamachary, Jacob A. Abraham:
Test generation for resistive opens in CMOS. ACM Great Lakes Symposium on VLSI 2002: 65-70
2001
[c2]
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Arun Krishnamachary, Jacob A. Abraham, Raghuram S. Tupuri:
Timing Verification and Delay Test Generation for Hierarchical Designs. VLSI Design 2001: 157-162

1990 – 1999

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1999
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Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. Abraham:
Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor. DAC 1999: 647-652

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