"Test generation for resistive opens in CMOS."

Arun Krishnamachary, Jacob A. Abraham (2002)

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DOI: 10.1145/505306.505321

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Arun Krishnamachary, Jacob A. Abraham:
Test generation for resistive opens in CMOS. ACM Great Lakes Symposium on VLSI 2002: 65-70

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