default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDJunichi Hirase
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2014
[j3]Junichi Hirase:
Verification of Moore's Law Using Actual Semiconductor Production Data. IEICE Trans. Electron. 97-C(6): 599-608 (2014)- [j2]Junichi Hirase:
Introduction of Yield Quadrant and Yield Capability Index for VLSI Manufacturing. IEICE Trans. Electron. 97-C(6): 609-618 (2014)
2000 – 2009
- 2008
- [c13]Junichi Hirase:
Defect Detection Rate through IDDQ for Production Testing. ATS 2008: 199-205 - 2005
- [c12]Junichi Hirase, Yoshiyuki Goi, Yoshiyuki Tanaka:
IDDQ Testing Method using a Scan Pattern for Production Testing. Asian Test Symposium 2005: 18-21 - [c11]Junichi Hirase, Tatsuya Furukawa:
Chip Identification using the Characteristic Dispersion of Transistor. Asian Test Symposium 2005: 188-193 - 2003
- [c10]Junichi Hirase:
Test Pattern Length Required to Reach the Desired Fault Coverage. Asian Test Symposium 2003: 508 - 2002
- [c9]Junichi Hirase:
High Precision Result Evaluation of VLSI. Asian Test Symposium 2002: 21-26 - 2001
- [c8]Junichi Hirase:
Test Time Reduction through Minimum Execution of Tester-Hardware Setting Instructions. Asian Test Symposium 2001: 173-178 - [c7]Junichi Hirase:
Yield Increase of VLSI after Redundancy-Repairing. Asian Test Symposium 2001: 353-358 - 2000
- [c6]Junichi Hirase, Shinichi Yoshimura:
Faster processing for microprocessor functional ATPG. Asian Test Symposium 2000: 191-197
1990 – 1999
- 1999
- [c5]Junichi Hirase, Shinichi Yoshimura, Tomohisa Sczaki:
Automatic Test Pattern Generation for Improving the Fault Coverage of Microprocessors. Asian Test Symposium 1999: 13-19 - [c4]Junichi Hirase, Naoki Shindou, Kouji Akahori:
Scan Chain Diagnosis Using IDDQ Current Measurement. Asian Test Symposium 1999: 153-157 - 1998
- [c3]Junichi Hirase:
Economical Importance of the Maximum Chip Area. Asian Test Symposium 1998: 64- - 1995
- [j1]Junichi Hirase, Masanori Hamada:
The Effect of CMOS VLSI IDDq Measurement on Defect Level. IEICE Trans. Inf. Syst. 78-D(7): 839-844 (1995) - [c2]Junichi Hirase:
Improvement of the Defect Level of Micro-computer LSI Testing. ITC 1995: 377-383 - [c1]Junichi Hirase:
Study on the Costs of On-site VLSI Testing. ITC 1995: 438-443
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 23:08 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
