"Test Pattern Length Required to Reach the Desired Fault Coverage."

Junichi Hirase (2003)

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DOI: 10.1109/ATS.2003.1250878

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Junichi Hirase:
Test Pattern Length Required to Reach the Desired Fault Coverage. Asian Test Symposium 2003: 508

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