"The Effect of CMOS VLSI IDDq Measurement on Defect Level."

Junichi Hirase, Masanori Hamada (1995)

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DOI: —

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type: Journal Article

metadata version: 2020-04-11

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Junichi Hirase, Masanori Hamada:
The Effect of CMOS VLSI IDDq Measurement on Defect Level. IEICE Trans. Inf. Syst. 78-D(7): 839-844 (1995)

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