"IDDQ Testing Method using a Scan Pattern for Production Testing."

Junichi Hirase, Yoshiyuki Goi, Yoshiyuki Tanaka (2005)

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DOI: 10.1109/ATS.2005.66

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Junichi Hirase, Yoshiyuki Goi, Yoshiyuki Tanaka:
IDDQ Testing Method using a Scan Pattern for Production Testing. Asian Test Symposium 2005: 18-21

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