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2020 – today
- 2024
[j23]Andrzej Dziedzic
, Szymon Wójcik, Miroslaw Gierczak, Slavko Bernik, Nana Brguljan, Kathrin Reinhardt, Stefan Körner:
Planar Thermoelectric Microgenerators in Application to Power RFID Tags. Sensors 24(5): 1646 (2024)
2010 – 2019
- 2018
- [j22]Arkadiusz Dabrowski, Andrzej Dziedzic:
Stability of low ohmic thick-film resistors under pulsed operation. Microelectron. Reliab. 84: 95-104 (2018) - 2014
- [j21]Damian Nowak, Andrzej Dziedzic:
Fabrication and advanced electrical and stability characterization of laser-shaped thick-film and LTCC microresistors for high temperature applications. Microelectron. Reliab. 54(11): 2641-2644 (2014) - 2012
- [j20]Wojciech Steplewski, Tomasz Serzysko, Grazyna Koziol, Andrzej Dziedzic:
Preliminary assessment of the stability of thin- and polymer thick-film resistors embedded into printed wiring boards. Microelectron. Reliab. 52(8): 1719-1725 (2012) - 2011
- [j19]Andrzej Dziedzic:
10th Electron Technology ELTE 2010 and 34th International Microelectronics and Packaging IMAPS/CPMT Poland Joint Conference - Guest Editorial. Microelectron. Reliab. 51(7): 1157-1158 (2011) - [j18]M. W. Dudek, Karol Nitsch, Andrzej Dziedzic, Tomasz Piasecki:
Wide frequency range ac electrical characterization of thick-film microvaristors. Microelectron. Reliab. 51(7): 1219-1224 (2011) - [j17]Damian Nowak, Andrzej Dziedzic:
LTCC package for high temperature applications. Microelectron. Reliab. 51(7): 1241-1244 (2011)
2000 – 2009
- 2009
- [j16]Andrzej Dziedzic:
IMAPS-CPMT Poland 2008 - Guest Editorial. Microelectron. Reliab. 49(6): 567-568 (2009) - [j15]Damian Nowak, Edward Mis, Andrzej Dziedzic, Jaroslaw Kita:
Fabrication and electrical properties of laser-shaped thick-film and LTCC microresistors. Microelectron. Reliab. 49(6): 600-606 (2009) - [j14]Edward Mis, Andrzej Dziedzic, Witold Mielcarek:
Microvaristors in thick-film and LTCC circuits. Microelectron. Reliab. 49(6): 607-613 (2009) - 2008
- [j13]Andrzej Dziedzic:
IMAPS Poland 2007 - Guest Editorial. Microelectron. Reliab. 48(6): 859 (2008) - [j12]Krzysztof Mleczko, Zbigniew Zawislak, Adam Witold Stadler, Andrzej Kolek, Andrzej Dziedzic, Jacek Cichosz:
Evaluation of conductive-to-resistive layers interaction in thick-film resistors. Microelectron. Reliab. 48(6): 881-885 (2008) - [j11]Piotr Markowski, Andrzej Dziedzic:
Planar and three-dimensional thick-film thermoelectric microgenerators. Microelectron. Reliab. 48(6): 890-896 (2008) - 2007
- [j10]Andrzej Dziedzic, Jan Felba:
Polytronic 2005. Microelectron. Reliab. 47(2-3): 327 (2007) - [j9]Andrzej Dziedzic:
Carbon/polyesterimide thick-film resistive composites - Experimental characterization and theoretical analysis of physicochemical, electrical and stability properties. Microelectron. Reliab. 47(2-3): 354-362 (2007) - 2006
- [j8]Andrzej Dziedzic, Andrzej Kolek, Waleed Ehrhardt, Heiko Thust:
Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors. Microelectron. Reliab. 46(2-4): 352-359 (2006) - 2005
- [j7]Andrzej Dziedzic:
IMAPS Poland 2004 - Guest Editorial. Microelectron. Reliab. 45(12): 1901-1902 (2005) - [j6]Darko Belavic, Marko Hrovat, Jaroslaw Kita, Janez Holc, Jena Cilensek, Leszek J. Golonka, Andrzej Dziedzic:
Evaluation of compatibility of thick-film PTC thermistors and LTCC structures. Microelectron. Reliab. 45(12): 1924-1929 (2005) - [j5]Marek Wronski, Slawomir Kaminski, Edward Mis, Andrzej Dziedzic:
New trim configurations for laser trimmed thick-film resistors - theoretical analysis, numerical simulation and experimental verification. Microelectron. Reliab. 45(12): 1941-1948 (2005) - 2003
- [j4]Andrzej Dziedzic:
Special Section on IMAPS-Europe 2002. Microelectron. Reliab. 43(3): 343 (2003) - [j3]Andrzej Dziedzic, Lars Rebenklau, Leszek J. Golonka, Klaus-Jürgen Wolter:
Fodel microresistors-processing and basic electrical properties. Microelectron. Reliab. 43(3): 377-383 (2003) - 2002
- [j2]Andrzej Dziedzic:
Electrical and structural investigations in reliability characterisation of modern passives and passive integrated components. Microelectron. Reliab. 42(4-5): 709-719 (2002) - 2001
- [j1]Andrzej Dziedzic, Leszek J. Golonka, Jaroslaw Kita, Heiko Thust, Karl-Heinz Drue, Reinhard Bauer, Lars Rebenklau, Klaus-Jürgen Wolter:
Electrical and stability properties and ultrasonic microscope characterisation of low temperature co-fired ceramics resistors. Microelectron. Reliab. 41(5): 669-676 (2001)
Coauthor Index
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