"Advanced electrical and stability characterization of untrimmed and ..."

Andrzej Dziedzic et al. (2006)

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DOI: 10.1016/J.MICROREL.2004.12.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Andrzej Dziedzic, Andrzej Kolek, Waleed Ehrhardt, Heiko Thust:
Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors. Microelectron. Reliab. 46(2-4): 352-359 (2006)

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