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"Stability of low ohmic thick-film resistors under pulsed operation."
Arkadiusz Dabrowski, Andrzej Dziedzic (2018)
- Arkadiusz Dabrowski, Andrzej Dziedzic:
Stability of low ohmic thick-film resistors under pulsed operation. Microelectron. Reliab. 84: 95-104 (2018)
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