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2020 – today
- 2021
[c5]Seung-Mo Kim, Thi Mi Hanh Nyugen, Jungwon Oh, Yongsu Lee, Soo Cheol Kang, Ho-In Lee, Cihyun Kim, Surajit Some, Hyeon Jun Hwang, Byoung Hun Lee:
Drastic reliability improvement using H2O2/UV treatment of HfO2 for heterogeneous integration. IRPS 2021: 1-6- 2020
- [c4]Kiyung Kim, Sunmean Kim
, Yongsu Lee, Daeyeon Kim, So-Young Kim, Seokhyeong Kang, Byoung Hun Lee:
Extreme Low Power Technology using Ternary Arithmetic Logic Circuits via Drastic Interconnect Length Reduction. ISMVL 2020: 155-158
2010 – 2019
- 2019
- [c3]So-Young Kim, Sunwoo Heo, Kiyung Kim, Myungwoo Son, Seung-Mo Kim, Ho-In Lee, Yongsu Lee, Hyeon Jun Hwang, Moon-Ho, Byoung Hun Lee:
Demonstration of ternary devices and circuits using dual channel graphene barristors. ISMVL 2019: 25-30 - 2018
- [c2]Soo Cheol Kang, Sang Kyung Lee, S. Heo, S. M. Kim, Sung Kwan Lim, Byoung Hun Lee:
Reliability characteristics of MIM capacitor studied with ΔC-F characteristics. IRPS 2018: 5-1 - 2016
- [c1]Sunwoo Heo, Jinwoo Noh, Yun Ji Kim, So-Young Kim, Abdul Karim Khan, Byoung Hun Lee:
Design of Ratioless Ternary Inverter Using Graphene Barristor. ISMVL 2016: 23-30 - 2015
- [j5]Byungjin Cho, Jongwon Yoon, Sung Kwan Lim, Ah Ra Kim, Sun-Young Choi, Dong-Ho Kim, Kyu-Hwan Lee, Byoung Hun Lee, Heung Cho Ko, Myung Gwan Hahm:
Metal Decoration Effects on the Gas-Sensing Properties of 2D Hybrid-Structures on Flexible Substrates. Sensors 15(10): 24903-24913 (2015) - [j4]Myonglae Chu, Byoungho Kim, Sangsu Park, Hyunsang Hwang, Moongu Jeon, Byoung Hun Lee, Byung-Geun Lee:
Neuromorphic Hardware System for Visual Pattern Recognition With Memristor Array and CMOS Neuron. IEEE Trans. Ind. Electron. 62(4): 2410-2419 (2015)
2000 – 2009
- 2007
- [j3]Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker:
Electrical characterization and analysis techniques for the high-kappa era. Microelectron. Reliab. 47(4-5): 479-488 (2007) - 2005
- [j2]Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff:
Probing stress effects in HfO2 gate stacks with time dependent measurements. Microelectron. Reliab. 45(5-6): 806-810 (2005) - 2004
- [j1]Gennadi Bersuker, Jang H. Sim, Chadwin D. Young, Rino Choi, Peter Zeitzoff, George A. Brown, Byoung Hun Lee, Robert W. Murto:
Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics. Microelectron. Reliab. 44(9-11): 1509-1512 (2004)
Coauthor Index
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