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Journal Articles
- 1992
[j4]Miron Abramovici, David T. Miller, Rabindra K. Roy:
Dynamic redundancy identification in automatic test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(3): 404-407 (1992)- 1986
- [j3]Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller:
SMART and FAST: Test Generation for VLSI Scan-Design Circuits. IEEE Des. Test 3(4): 43-54 (1986) - [j2]Miron Abramovici, Prem R. Menon, David T. Miller:
Checkpoint Faults are not Sufficient Target Faults for Test Generation. IEEE Trans. Computers 35(8): 769-771 (1986) - 1984
- [j1]Miron Abramovici, Prem R. Menon, David T. Miller:
Critical Path Tracing: An Alternative to Fault Simulation. IEEE Des. Test 1(1): 83-93 (1984)
Conference and Workshop Papers
- 1992
- [c8]Miron Abramovici, Krishna B. Rajan, David T. Miller:
Freeze!: A New Approach for Testing Sequential Circuits. DAC 1992: 22-25 - 1990
- [c7]Miron Abramovici, David T. Miller, R. Henning:
Global cost functions for test generation. ITC 1990: 35-43 - 1989
- [c6]Miron Abramovici, David T. Miller, Rabindra K. Roy:
Dynamic redundancy identification in automatic test generation. ICCAD 1989: 466-469 - [c5]Miron Abramovici, J. W. Bierbauer, R. H. Hellman, C. L. Hong, David T. Miller, R. G. Taylor:
System-level design verification in the AT&T computer division: overview and strategy. ICCD 1989: 542-547 - [c4]Miron Abramovici, James J. Kulikowski, David T. Miller, Prem R. Menon:
System-level design verification in the AT&T Computer Division: tools. ICCD 1989: 548-554 - 1985
- [c3]Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller:
Test Generation In Lamp2: System Overview. ITC 1985: 45-48 - [c2]Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller:
Test Generation In Lamp2: Concepts and Algorithms. ITC 1985: 49-56 - 1983
- [c1]Miron Abramovici, Prem R. Menon, David T. Miller:
Critical path tracing - an alternative to fault simulation. DAC 1983: 214-220
Coauthor Index
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