"SMART and FAST: Test Generation for VLSI Scan-Design Circuits."

Miron Abramovici et al. (1986)

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DOI: 10.1109/MDT.1986.294975

access: closed

type: Journal Article

metadata version: 2021-03-05

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Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller:
SMART and FAST: Test Generation for VLSI Scan-Design Circuits. IEEE Des. Test 3(4): 43-54 (1986)

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