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James J. Kulikowski

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Journal Articles

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1986
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Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller:
SMART and FAST: Test Generation for VLSI Scan-Design Circuits. IEEE Des. Test 3(4): 43-54 (1986)

Conference and Workshop Papers

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1991
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Miron Abramovici, James J. Kulikowski, Rabindra K. Roy:
The Best Flip-Flops to Scan. ITC 1991: 166-173
1989
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Miron Abramovici, James J. Kulikowski, David T. Miller, Prem R. Menon:
System-level design verification in the AT&T Computer Division: tools. ICCD 1989: 548-554
1985
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Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller:
Test Generation In Lamp2: System Overview. ITC 1985: 45-48
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Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller:
Test Generation In Lamp2: Concepts and Algorithms. ITC 1985: 49-56

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