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ORCIDYasuo Nakagawa
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Journal Articles
- 2009
[j6]Yuichi Hamamura, Chizu Matsumoto, Yoshiyuki Tsunoda, Koji Kamoda, Yoshio Iwata, Kenji Kanamitsu, Daisuke Fujiki, Fujihiko Kojika, Hiromi Fujita, Yasuo Nakagawa, Shun'ichi Kaneko:
Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing. IEICE Trans. Electron. 92-C(1): 144-152 (2009)- 1994
- [j5]Shree K. Nayar, Yasuo Nakagawa:
Shape from Focus. IEEE Trans. Pattern Anal. Mach. Intell. 16(8): 824-831 (1994) - 1990
- [j4]Yukio Matsuyama, Hisafumi Iwata, Hitoshi Kubota, Yasuo Nakagawa:
Precise Visual Inspection of LSI Wafer Patterns by Local Perturbation Pattern Matching Algorithm. Syst. Comput. Jpn. 21(9): 99-112 (1990) - [j3]Shunji Maeda, Hitoshi Kubota, Hiroshi Makihira, Takanori Ninomiya, Yasuo Nakagawa, Yuzo Taniguchi:
Automated visual inspection for lsi water multilayer patterns by cascade pattern matching algorithm. Syst. Comput. Jpn. 21(12): 65-77 (1990) - 1979
- [j2]Yasuo Nakagawa, Azriel Rosenfeld:
A note on polygonal and elliptical approximation of mechanical parts. Pattern Recognit. 11(2): 133-142 (1979) - [j1]Yasuo Nakagawa, Azriel Rosenfeld:
Some experiments on variable thresholding. Pattern Recognit. 11(3): 191-204 (1979)
Conference and Workshop Papers
- 1994
- [c7]Takashi Hiroi, Shunji Maeda, Hitoshi Kubota, Kenji Watanabe, Yasuo Nakagawa:
Precise visual inspection for LSI wafer patterns using subpixel image alignment. WACV 1994: 26-34 - 1992
- [c6]Takanori Ninomiya, Kazushi Yoshimura, Mineo Nomoto, Yasuo Nakagawa:
Automatic screen-printed circuit pattern inspection using connectivity preserving image reduction and connectivity comparison. ICPR (1) 1992: 53-56 - [c5]Takashi Hiroi, Kazushi Yoshimura, Takanori Ninomiya, Toshimitsu Hamada, Yasuo Nakagawa, Shigeki Mio, Kouichi Karasaki, Hideaki Sasaki:
Development of Solder Joint Inspection Method Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection Method. MVA 1992: 429-434 - 1990
- [c4]Shree K. Nayar, Yasuo Nakagawa:
Shape from focus: an effective approach for rough surfaces. ICRA 1990: 218-225 - [c3]Takanori Ninomiya, Yasuo Nakagawa:
Precise Position Detection of a Mesh-Backed Printing Screen Based on the Smallest Enclosing Circle Detection. MVA 1990: 23-26 - 1989
- [c2]Takanori Ninomiya, Mineo Nomoto, Yasuo Nakagawa:
Automatic 2 1/2 D shape inspection system for via-hole fillings of green sheets by shadow image analysis. ICRA 1989: 515-520 - 1988
- [c1]Yukio Matsuyama, Hisafumi Iwata, Hitoshi Kubota, Yasuo Nakagawa:
Precise Visual Inspection Algorithm for LSI Wafer Patterns Using Grayscale Image Comparison. MVA 1988: 401-404
Coauthor Index
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