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V. Swamy Irrinki

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Journal Articles

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2003
[j2]
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  - journals/mj/KarimiICPL03
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Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi:
Parallel testing of multi-port static random access memories. Microelectron. J. 34(1): 3-21 (2003)
2000
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Jun Zhao, V. Swamy Irrinki, Mukesh Puri, Fabrizio Lombardi:
Testing SRAM-Based Content Addressable Memories. IEEE Trans. Computers 49(10): 1054-1063 (2000)

Conference and Workshop Papers

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2001
[c3]
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  - conf/mtdt/KarimiLIC01
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Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby:
A Parallel Approach for Testing Multi-Port Static Random Access Memories. MTDT 2001: 73-
2000
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Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri:
Optimizing Memory Tests by Analyzing Defect Coverage. MTDT 2000: 20-28
[c1]
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Jun Zhao, V. Swamy Irrinki, Mukesh Puri, Fabrizio Lombardi:
Detection of Inter-Port Faults in Multi-Port Static RAMs. VTS 2000: 297-304

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