"Parallel testing of multi-port static random access memories."

Farzin Karimi et al. (2003)

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DOI: 10.1016/S0026-2692(02)00124-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi:
Parallel testing of multi-port static random access memories. Microelectron. J. 34(1): 3-21 (2003)

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