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ORCIDAbhishek Singh 0001
Person information
- affiliation: University of Maryland, Baltimore County, MD, USA
Other persons with the same name
- Abhishek Singh — disambiguation page
- Abhishek Singh 0002 — Apple, Inc. (and 1 more)
- Abhishek Singh 0003
![[0000-0002-9396-2764]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0000-0002-9396-2764")
— University of Oslo, Department of Informatics, Norway - Abhishek Singh 0004 — North Carolina State University, Raleigh, NC, USA
- Abhishek Singh 0005 — Massachusetts Institute of Technology, Cambridge, MA, USA
- Abhishek 0003 (aka: Abhishek Singh 0006) — Indian Institute of Information Technology-Allahabad, India
- Abhishek Singh 0007 — Washington University in Saint Louis, MO, USA (and 1 more)
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2000 – 2009
- 2006
[j4]Jim Plusquellic, Dhruva Acharyya, Abhishek Singh, Mohammad Tehranipoor, Chintan Patel:
Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method. IEEE Des. Test Comput. 23(4): 278-293 (2006)- [j3]Abhishek Singh, Jim Plusquellic, Dhananjay S. Phatak, Chintan Patel:
Defect Simulation Methodology for iDDT Testing. J. Electron. Test. 22(3): 255-272 (2006) - 2005
- [j2]Chintan Patel, Abhishek Singh, Jim Plusquellic:
Defect Detection Using Quiescent Signal Analysis. J. Electron. Test. 21(5): 463-483 (2005) - 2004
- [c7]Abhishek Singh, Chintan Patel, Jim Plusquellic:
On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing. ITC 2004: 262-270 - [c6]Chintan Patel, Abhishek Singh, Jim Plusquellic:
Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement. ITC 2004: 319-328 - [c5]Abhishek Singh, Chintan Patel, Jim Plusquellic:
Fault Simulation Model for i{DDT} Testing: An Investigation. VTS 2004: 304-312 - 2003
- [j1]James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker:
Power supply transient signal analysis for defect-oriented test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 370-374 (2003) - [c4]Abhishek Singh, Dhananjay S. Phatak, Tom Goff, Mike Riggs, James F. Plusquellic, Chintan Patel:
Comparison of Branching CORDIC Implementations. ASAP 2003: 215-225 - [c3]Abhishek Singh, Jitin Tharian, Jim Plusquellic:
Path Delay Estimation using Power Supply Transient Signals: A Comparative Study using Fourier and Wavelet Analysis. ICCAD 2003: 748-753 - 2002
- [c2]Abhishek Singh, Jim Plusquellic, Anne E. Gattiker:
Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models. VTS 2002: 357-366 - 2001
- [c1]Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker:
Detecting delay faults using power supply transient signal analysis. ITC 2001: 395-404
Coauthor Index
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