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ORCIDCristina De Luca
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2020 – today
- 2023
[c12]Fabio De Felice, Cristina De Luca, Simona Di Chiara, Antonella Petrillo:
Physical and digital worlds: implications and opportunities of the metaverse. ISM 2023: 1744-1754- 2021
- [c11]Luca Silvestri, Cecilia Silvestri, Antonio Forcina, Cristina De Luca:
A review of energy-based indicators for assessing sustainability and circular economy in the agri-food production. ISM 2021: 1756-1765 - [c10]Fabio De Felice, Antonella Petrillo, Cristina De Luca, Ilaria Baffo:
Artificial Intelligence or Augmented Intelligence? Impact on our lives, rights and ethics. ISM 2021: 1846-1856
2010 – 2019
- 2018
- [c9]Federica Acerbi, Giuseppe De Nicolao, Josef Obiltschnig, Patrick Richter, Cristina De Luca:
Accuracy and Robustness Against Covariate Shift of Water Chiller Models. CASE 2018: 809-816 - 2015
- [j1]Daniel Kurz, Cristina De Luca, Jürgen Pilz:
A Sampling Decision System for Virtual Metrology in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 12(1): 75-83 (2015) - 2014
- [c8]Daniel Kurz, Jürgen Pilz, Andrea Schirru
, Simone Pampuri, Cristina De Luca:
A sampling decision system for semiconductor manufacturing: relying on virtual metrology and actual measurements. WSC 2014: 2649-2660 - 2013
- [c7]Daniel Kurz, Cristina De Luca, Jürgen Pilz:
Monitoring virtual metrology reliability in a sampling decision system. CASE 2013: 20-25 - 2012
- [c6]Daniel Kurz, Cristina De Luca, Jürgen Pilz:
Sampling Decision System in semiconductor manufacturing using Virtual Metrology. CASE 2012: 74-79 - [c5]Simone Pampuri, Andrea Schirru, Gian Antonio Susto, Cristina De Luca, Alessandro Beghi, Giuseppe De Nicolao:
Multistep virtual metrology approaches for semiconductor manufacturing processes. CASE 2012: 91-96 - 2011
- [c4]Simone Pampuri, Andrea Schirru, Cristina De Luca, Giuseppe De Nicolao:
Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing. CASE 2011: 250-255 - [c3]Gian Antonio Susto, Alessandro Beghi, Cristina De Luca:
A Predictive Maintenance System for Silicon Epitaxial Deposition. CASE 2011: 262-267 - [c2]Gian Antonio Susto, Alessandro Beghi, Cristina De Luca:
A Virtual Metrology system for predicting CVD thickness with equipment variables and qualitative clustering. ETFA 2011: 1-4 - [c1]Andrea Schirru, Simone Pampuri, Cristina De Luca, Giuseppe De Nicolao:
Nonparametric Virtual Sensors for Semiconductor Manufacturing - Using Information Theoretic Learning and Kernel Machines. ICINCO (2) 2011: 349-358
Coauthor Index
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