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Rodolfo A. Rodriguez-Davila

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Conference and Workshop Papers

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2024
[c4]
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Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, B. Gnade, Manuel Quevedo-Lopez, Chadwin D. Young:
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. IRPS 2024: 1-6
2020
[c3]
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Rodolfo A. Rodriguez-Davila, Richard A. Chapman, Massimo Catalano, Manuel Quevedo-Lopez, Chadwin D. Young:
Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3. IRPS 2020: 1-5
2019
[c2]
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  - conf/irps/BolshakovRQY19
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Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Manuel Quevedo-Lopez, Chadwin D. Young:
Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric. IRPS 2019: 1-5
2018
[c1]
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  - conf/icicdt/YoungBRZKMQHW18
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Chadwin D. Young, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Peng Zhao, Ava Khosravi, Israel Mejia, Manuel Quevedo-Lopez, Christopher L. Hinkle, Robert M. Wallace:
Electrical characterization of process induced effects on non-silicon devices. ICICDT 2018: 173-176

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