"Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to ..."

Rodolfo A. Rodriguez-Davila et al. (2024)

> Home

Details and statistics

DOI: 10.1109/IRPS48228.2024.10529390

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/RodriguezDavilaFFMBGQY24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/RodriguezDavilaFFMBGQY24
Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, B. Gnade, Manuel Quevedo-Lopez, Chadwin D. Young:
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. IRPS 2024: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.