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Sung-Il Chan

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Journal Articles

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2018
[j4]
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  - journals/mr/KimCPCJ18
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  - https://dblp.org/rec/journals/mr/KimCPCJ18
Dongshin Kim, Ju-Hwan Choi, Nochang Park, Sung-Il Chan, Yongchae Jeong:
Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection. Microelectron. Reliab. 88-90: 411-417 (2018)
2017
[j3]
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Wonwook Oh, Soo Hyun Bae, Sung-Il Chan, Hae-Seok Lee, Donghwan Kim, Nochang Park:
Field degradation prediction of potential induced degradation of the crystalline silicon photovoltaic modules based on accelerated test and climatic data. Microelectron. Reliab. 76-77: 596-600 (2017)
2016
[j2]
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Wonwook Oh, Junhee Kim, Byungjun Kang, Soo Hyun Bae, Kyung Dong Lee, Hae-Seok Lee, Donghwan Kim, Sung-Il Chan:
Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection. Microelectron. Reliab. 64: 646-649 (2016)
2011
[j1]
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  - journals/mr/ChanHKYHJ11
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Sung-Il Chan, W. S. Hong, K. T. Kim, Yang Gi Yoon, J. H. Han, Joong Soon Jang:
Accelerated life test of high power white light emitting diodes based on package failure mechanisms. Microelectron. Reliab. 51(9-11): 1806-1809 (2011)

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