"Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection."

Dongshin Kim et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.117

access: closed

type: Journal Article

metadata version: 2021-10-14

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Dongshin Kim, Ju-Hwan Choi, Nochang Park, Sung-Il Chan, Yongchae Jeong:
Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection. Microelectron. Reliab. 88-90: 411-417 (2018)

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