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Nochang Park
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2010 – 2019
- 2018
- [j8]Dongshin Kim, Ju-Hwan Choi
, Nochang Park, Sung-Il Chan, Yongchae Jeong:
Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection. Microelectron. Reliab. 88-90: 411-417 (2018) - [j7]Wonwook Oh
, Soo Hyun Bae, Donghwan Kim, Nochang Park:
Initial detection of potential-induced degradation using dark I-V characteristics of crystalline silicon photovoltaic modules in the outdoors. Microelectron. Reliab. 88-90: 998-1002 (2018) - 2017
- [j6]Wonwook Oh, Soo Hyun Bae, Sung-Il Chan, Hae-Seok Lee, Donghwan Kim, Nochang Park:
Field degradation prediction of potential induced degradation of the crystalline silicon photovoltaic modules based on accelerated test and climatic data. Microelectron. Reliab. 76-77: 596-600 (2017) - 2014
- [j5]Nochang Park, Jae-Seong Jeong, Changwoon Han:
Estimation of the degradation rate of multi-crystalline silicon photovoltaic module under thermal cycling stress. Microelectron. Reliab. 54(8): 1562-1566 (2014) - [j4]Wonwook Oh, Seongtak Kim, Soo Hyun Bae, Nochang Park, Yoonmook Kang, Hae-Seok Lee, Donghwan Kim:
The degradation of multi-crystalline silicon solar cells after damp heat tests. Microelectron. Reliab. 54(9-10): 2176-2179 (2014) - 2013
- [j3]Nochang Park, Changwoon Han, Donghwan Kim:
Effect of moisture condensation on long-term reliability of crystalline silicon photovoltaic modules. Microelectron. Reliab. 53(12): 1922-1926 (2013) - 2012
- [j2]Jae-Seong Jeong, Nochang Park, Changwoon Han:
Field failure mechanism study of solder interconnection for crystalline silicon photovoltaic module. Microelectron. Reliab. 52(9-10): 2326-2330 (2012) - 2010
- [j1]Changwoon Han, Chulmin Oh
, Nochang Park, Wonsik Hong:
Creep lifetime prediction of solder joint for heat sink assembly. Microelectron. Reliab. 50(9-11): 1645-1649 (2010)
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