"Accelerated life test of high power white light emitting diodes based on ..."

Sung-Il Chan et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.042

access: closed

type: Journal Article

metadata version: 2024-08-14

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Sung-Il Chan, W. S. Hong, K. T. Kim, Yang Gi Yoon, J. H. Han, Joong Soon Jang:
Accelerated life test of high power white light emitting diodes based on package failure mechanisms. Microelectron. Reliab. 51(9-11): 1806-1809 (2011)

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