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Journal Articles
- 2016
[j3]Gian Antonio Susto
, Andrea Schirru, Simone Pampuri, Seán F. McLoone:
Supervised Aggregative Feature Extraction for Big Data Time Series Regression. IEEE Trans. Ind. Informatics 12(3): 1243-1252 (2016)- 2015
- [j2]Gian Antonio Susto, Simone Pampuri, Andrea Schirru, Alessandro Beghi, Giuseppe De Nicolao:
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach. Comput. Oper. Res. 53: 328-337 (2015) - [j1]Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Seán F. McLoone, Alessandro Beghi:
Machine Learning for Predictive Maintenance: A Multiple Classifier Approach. IEEE Trans. Ind. Informatics 11(3): 812-820 (2015)
Conference and Workshop Papers
- 2018
- [c14]Gian Antonio Susto, Matteo Terzi, Chiara Masiero, Simone Pampuri, Andrea Schirru:
A Fraud Detection Decision Support System via Human On-Line Behavior Characterization and Machine Learning. AI4I 2018: 9-14 - 2014
- [c13]Simone Pampuri, Gian Antonio Susto, Jian Wan, Adrian B. Johnston, Paul G. O'Hara, Seán F. McLoone:
Insight extraction for semiconductor manufacturing processes. CASE 2014: 786-791 - [c12]Gian Antonio Susto, Jian Wan, Simone Pampuri, Mattia Zanon, Adrian B. Johnston, Paul G. O'Hara, Seán F. McLoone:
An adaptive machine learning decision system for flexible predictive maintenance. CASE 2014: 806-811 - [c11]Daniel Kurz, Jürgen Pilz, Andrea Schirru, Simone Pampuri, Cristina De Luca:
A sampling decision system for semiconductor manufacturing: relying on virtual metrology and actual measurements. WSC 2014: 2649-2660 - 2013
- [c10]Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Daniele Pagano, Seán F. McLoone, Alessandro Beghi:
A predictive maintenance system for integral type faults based on support vector machines: An application to ion implantation. CASE 2013: 195-200 - [c9]Gian Antonio Susto, Seán F. McLoone, Daniele Pagano, Andrea Schirru, Simone Pampuri, Alessandro Beghi:
Prediction of integral type failures in semiconductor manufacturing through classification methods. ETFA 2013: 1-4 - 2012
- [c8]Simone Pampuri, Andrea Schirru, Gian Antonio Susto, Cristina De Luca, Alessandro Beghi, Giuseppe De Nicolao:
Multistep virtual metrology approaches for semiconductor manufacturing processes. CASE 2012: 91-96 - [c7]Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao, Alessandro Beghi:
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control. CASE 2012: 358-363 - [c6]Andrea Schirru, Gian Antonio Susto, Simone Pampuri, Seán F. McLoone:
Learning from time series: Supervised Aggregative Feature Extraction. CDC 2012: 5254-5259 - 2011
- [c5]Simone Pampuri, Andrea Schirru, Giuseppe Fazio, Giuseppe De Nicolao:
Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing. CASE 2011: 244-249 - [c4]Simone Pampuri, Andrea Schirru, Cristina De Luca, Giuseppe De Nicolao:
Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing. CASE 2011: 250-255 - [c3]Andrea Schirru, Simone Pampuri, Cristina De Luca, Giuseppe De Nicolao:
Nonparametric Virtual Sensors for Semiconductor Manufacturing - Using Information Theoretic Learning and Kernel Machines. ICINCO (2) 2011: 349-358 - 2010
- [c2]Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao:
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing. CASE 2010: 51-56 - [c1]Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao:
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing. CASE 2010: 57-62
Coauthor Index
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