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"Prediction of integral type failures in semiconductor manufacturing ..."
Gian Antonio Susto et al. (2013)
- Gian Antonio Susto, Seán F. McLoone, Daniele Pagano, Andrea Schirru, Simone Pampuri, Alessandro Beghi:
Prediction of integral type failures in semiconductor manufacturing through classification methods. ETFA 2013: 1-4
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