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2020 – today
- 2022
[j3]Saverio Messineo
, Michael R. P. Ragazzon, Fabio Busnelli, Jan Tommy Gravdahl:
Analysis of PI-Control for Atomic Force Microscopy in Contact Mode. IEEE Trans. Control. Syst. Technol. 30(4): 1681-1695 (2022)
2010 – 2019
- 2019
- [j2]Michael R. P. Ragazzon, Jan Tommy Gravdahl, Kristin Ytterstad Pettersen:
Model-Based Identification of Nanomechanical Properties in Atomic Force Microscopy: Theory and Experiments. IEEE Trans. Control. Syst. Technol. 27(5): 2045-2057 (2019) - 2018
- [j1]Michael R. P. Ragazzon, Michael G. Ruppert, David M. Harcombe, Andrew J. Fleming, Jan Tommy Gravdahl:
Lyapunov Estimator for High-Speed Demodulation in Dynamic Mode Atomic Force Microscopy. IEEE Trans. Control. Syst. Technol. 26(2): 765-772 (2018) - 2017
- [c6]David M. Harcombe, Michael G. Ruppert, Michael R. P. Ragazzon, Andrew J. Fleming:
Higher-harmonic AFM imaging with a high-bandwidth multifrequency Lyapunov filter. AIM 2017: 725-730 - [c5]Michael G. Ruppert, David M. Harcombe, Michael R. P. Ragazzon, S. O. Reza Moheimani, Andrew J. Fleming:
Frequency domain analysis of robust demodulators for high-speed atomic force microscopy. ACC 2017: 1562-1567 - [c4]Michael R. P. Ragazzon, Jan Tommy Gravdahl, Kristin Ytterstad Pettersen:
Exponential convergence bounds in least squares estimation: Identification of viscoelastic properties in atomic force microscopy. CCTA 2017: 687-694 - 2016
- [c3]Michael R. P. Ragazzon, Jan Tommy Gravdahl:
Imaging topography and viscoelastic properties by constant depth atomic force microscopy. CCA 2016: 923-928 - [c2]Michael R. P. Ragazzon, Jan Tommy Gravdahl, Andrew J. Fleming:
On Amplitude Estimation for High-Speed Atomic Force Microscopy. ACC 2016: 2635-2642 - 2015
- [c1]Michael R. P. Ragazzon, Jan Tommy Gravdahl, Kristin Ytterstad Pettersen, Arnfinn Aas Eielsen:
Topography and force imaging in atomic force microscopy by state and parameter estimation. ACC 2015: 3496-3502
Coauthor Index
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