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2020 – today
- 2022
[j4]Youngkwang Lee, Young-Woo Lee
, Sungyoul Seo, Sungho Kang:
Reduced-Pin-Count BOST for Test-Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(3): 750-761 (2022)
2010 – 2019
- 2019
- [j3]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 551-561 (2019) - 2018
- [j2]Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang:
A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test. IEEE J. Emerg. Sel. Topics Circuits Syst. 8(3): 391-403 (2018) - [c9]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
2-D Failure Bitmap Compression Using Line Fault Marking Method. ISOCC 2018: 21-22 - 2017
- [c8]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An efficient built-in self-repair scheme for area reduction. ISOCC 2017: 105-106 - [c7]Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang:
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. ISQED 2017: 191-195 - [c6]Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang:
Broadcast scan compression based on deterministic pattern generation algorithm. ISQED 2017: 449-453 - 2016
- [j1]Sungyoul Seo, Yong Lee, Sungho Kang:
Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(2): 274-284 (2016) - [c5]Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang:
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC 2016: 39-40 - [c4]Junghwan Kim, Young-Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang:
A test methodology to screen scan-path failures. ISOCC 2016: 149-150 - 2015
- [c3]Sungyoul Seo, Yong Lee, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang:
Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. ATS 2015: 1-6 - [c2]Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang:
A scan shifting method based on clock gating of multiple groups for low power scan testing. ISQED 2015: 162-166 - [c1]Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang:
Low power scan bypass technique with test data reduction. ISQED 2015: 173-176
Coauthor Index
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