"A test methodology to screen scan-path failures."

Junghwan Kim et al. (2016)

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DOI: 10.1109/ISOCC.2016.7799831

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Junghwan Kim, Young-Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang:
A test methodology to screen scan-path failures. ISOCC 2016: 149-150

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