"Reduced-Pin-Count BOST for Test-Cost Reduction."

Youngkwang Lee et al. (2022)

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DOI: 10.1109/TCAD.2021.3065912

access: closed

type: Journal Article

metadata version: 2024-02-27

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Youngkwang Lee, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
Reduced-Pin-Count BOST for Test-Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(3): 750-761 (2022)

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