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Journal Articles
- 2014
[j2]Nai-Wen Chang, Cheng-Yen Tsai, Sun-Yuan Hsieh:
On 3-Extra Connectivity and 3-Extra Edge Connectivity of Folded Hypercubes. IEEE Trans. Computers 63(6): 1594-1600 (2014)- 2013
- [j1]Sun-Yuan Hsieh, Cheng-Yen Tsai, Chun-An Chen:
Strong Diagnosability and Conditional Diagnosability of Multiprocessor Systems and Folded Hypercubes. IEEE Trans. Computers 62(7): 1472-1477 (2013)
Conference and Workshop Papers
- 2022
- [c7]Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang
, Andrew Yi-Ann Huang, Chen-Shiun Lee, Leon Li-Yang Chen, Peter Yi-Yu Liao, Nova Cheng-Yen Tsai:
Wafer Defect Pattern Classification with Explainable-Decision Tree Technique. ITC 2022: 549-553 - 2021
- [c6]Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Nova Cheng-Yen Tsai, Leon Chou, Gus Chang-Hung Han, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu:
Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering. ETS 2021: 1-2 - [c5]Yu-Jen Chen, Cheng-Yen Tsai, Xiaowei Xu, Yiyu Shi, Tsung-Yi Ho, Meiping Huang, Haiyun Yuan, Jian Zhuang:
Ct Image Denoising With Encoder-Decoder Based Graph Convolutional Networks. ISBI 2021: 400-404 - [c4]Peter Yi-Yu Liao, Katherine Shu-Min Li, Leon Li-Yang Chen, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng, Nova Cheng-Yen Tsai, Leon Chou:
WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques. ITC 2021: 309-313 - 2020
- [c3]Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen:
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. DATE 2020: 1710-1711 - [c2]Leon Li-Yang Chen, Katherine Shu-Min Li, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Andrew Yi-Ann Huang, Leon Chou, Nova Cheng-Yen Tsai, Chen-Shiun Lee:
TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning. ITC 2020: 1-4 - 2019
- [c1]Andrew Yi-Ann Huang, Katherine Shu-Min Li, Cheng-Yen Tsai, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Xu-Hao Jiang, Leon Chou, Chen-Shiun Lee:
TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning. ITC 2019: 1-6
Coauthor Index
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