default search action
Theo Smedes
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2018
- [c2]Guido Quax, Theo Smedes:
An integral injector-victim current transfer model for latchup design rule optimization. IRPS 2018: 2 - 2013
- [j12]Theo Smedes, M. Polewski, A. van IJzerloo, Jean Luc Lefebvre, M. Dekker:
Pitfalls for CDM calibration procedures. Microelectron. Reliab. 53(2): 190-195 (2013) - 2011
- [j11]Guido Notermans, Dejan M. Maksimovic, Gerd Vermont, Michiel van Maasakkers, Fredrik Pusa, Theo Smedes:
On-chip system level protection of FM antenna pin with improved linearity. Microelectron. Reliab. 51(12): 2129-2136 (2011) - 2010
- [j10]Guido Notermans, Theo Smedes, Zeljko Mrcarica, Peter C. de Jong, Ralph Stephan, Hans van Zwol, Dejan M. Maksimovic:
ESD protection for thin gate oxides in 65 nm. Microelectron. Reliab. 50(1): 26-31 (2010)
2000 – 2009
- 2009
- [j9]Theo Smedes:
ESD testing of devices, ICs and systems. Microelectron. Reliab. 49(9-11): 941-945 (2009) - [j8]Guido Notermans, Olivier Quittard, Anco Heringa, Zeljko Mrcarica, Fabrice Blanc, Hans van Zwol, Theo Smedes, Thomas Keller, Peter C. de Jong:
ESD robust high-voltage active clamps. Microelectron. Reliab. 49(12): 1433-1439 (2009) - [j7]Dejan M. Maksimovic, Fabrice Blanc, Guido Notermans, Theo Smedes, Thomas Keller:
An ESD test reduction method for complex devices. Microelectron. Reliab. 49(12): 1465-1469 (2009) - 2007
- [j6]Theo Smedes, J. de Boet, T. Rödle:
Selecting an appropriate ESD protection for discrete RF power LDMOSTs. Microelectron. Reliab. 47(7): 1000-1007 (2007) - 2005
- [j5]M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper:
A 3-D Circuit Model to evaluate CDM performance of ICs. Microelectron. Reliab. 45(9-11): 1425-1429 (2005) - 2004
- [j4]F. Barbier, Fabrice Blanc, A. Le Grontec, R. Colclaser, Theo Smedes, M. Johnson, Serge Bardy, Philippe Descamps:
Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current. Microelectron. Reliab. 44(9-11): 1799-1804 (2004) - [j3]T. Wu, Theo Smedes, J. P. Lokker, S.-N. Mei, J. W. Slotboom:
A case study of ESD failures at random levels: analysis, explanation and solution. Microelectron. Reliab. 44(9-11): 1823-1827 (2004) - 2003
- [j2]M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper:
Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. Microelectron. Reliab. 43(9-11): 1569-1575 (2003) - [c1]Albert Jan Huitsing, Theo Smedes, H.-U. Schröder:
A simple design methodology for increased ESD robustness of CMOS core cells. ESSCIRC 2003: 481-484 - 2002
- [j1]M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper:
The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. Microelectron. Reliab. 42(9-11): 1287-1292 (2002)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from , , and to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 22:52 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint