"ESD protection for thin gate oxides in 65 nm."

Guido Notermans et al. (2010)

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DOI: 10.1016/J.MICROREL.2009.09.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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Guido Notermans, Theo Smedes, Zeljko Mrcarica, Peter C. de Jong, Ralph Stephan, Hans van Zwol, Dejan M. Maksimovic:
ESD protection for thin gate oxides in 65 nm. Microelectron. Reliab. 50(1): 26-31 (2010)

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