"Study and validation of a power-rail ESD clamp in BiCMOS process with a ..."

F. Barbier et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.088

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type: Journal Article

metadata version: 2020-02-22

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F. Barbier, Fabrice Blanc, A. Le Grontec, R. Colclaser, Theo Smedes, M. Johnson, Serge Bardy, Philippe Descamps:
Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current. Microelectron. Reliab. 44(9-11): 1799-1804 (2004)

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