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"An ESD test reduction method for complex devices."
Dejan M. Maksimovic et al. (2009)
- Dejan M. Maksimovic, Fabrice Blanc, Guido Notermans, Theo Smedes, Thomas Keller:
An ESD test reduction method for complex devices. Microelectron. Reliab. 49(12): 1465-1469 (2009)
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