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ORCIDJurriaan Schmitz
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2020 – today
- 2023
[c6]Jelle H. T. Bakker, Mark S. Oude Alink
, Jurriaan Schmitz, Bram Nauta:
Characterisation of Photodiodes in 22 nm FDSOI at 850 nm. ESSDERC 2023: 65-68- 2020
- [c5]Maurits J. de Jong, Cora Salm, Jurriaan Schmitz:
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. IRPS 2020: 1-6
2010 – 2019
- 2018
- [j6]Maurits J. de Jong, Cora Salm, Jurriaan Schmitz:
Towards understanding recovery of hot-carrier induced degradation. Microelectron. Reliab. 88-90: 147-151 (2018) - 2017
- [j5]Maurits J. de Jong, Cora Salm, Jurriaan Schmitz:
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs. Microelectron. Reliab. 76-77: 136-140 (2017) - 2014
- [c4]Giulia Piccolo, Piet I. Kuindersma, Lars-Åke Ragnarsson, Raymond J. E. Hueting, Nadine Collaert, Jurriaan Schmitz:
Silicon LEDs in FinFET technology. ESSDERC 2014: 274-277 - [c3]Alessandro Ferrara, Peter G. Steeneken, Boni K. Boksteen, Anco Heringa, Andries J. Scholten, Jurriaan Schmitz, Raymond J. E. Hueting:
Identifying failure mechanisms in LDMOS transistors by analytical stability analysis. ESSDERC 2014: 321-324 - 2013
- [c2]Giulia Piccolo, Amir Sammak, Raymond J. E. Hueting, Jurriaan Schmitz, Lis K. Nanver:
Role of junction depth in light emission from silicon p-i-n leds. ESSDERC 2013: 119-122 - 2012
- [c1]Alfons W. Groenland, Elizaveta Vereshchagina, Alexey Y. Kovalgin, Rob A. M. Wolters, J. G. E. Gardeniers, Jurriaan Schmitz:
Micro- and nano-link ultra-low power heaters for sensors. ESSDERC 2012: 169-172
2000 – 2009
- 2008
- [j4]Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz:
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. Microelectron. Reliab. 48(8-9): 1139-1143 (2008) - [j3]Guido T. Sasse, Mustafa Acar, Fred G. Kuper, Jurriaan Schmitz:
RF CMOS reliability simulations. Microelectron. Reliab. 48(8-9): 1581-1585 (2008) - 2007
- [j2]Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz:
Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectron. Reliab. 47(4-5): 577-580 (2007) - 2006
- [j1]Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz:
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectron. Reliab. 46(9-11): 1617-1622 (2006)
Coauthor Index
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