"Reduced temperature dependence of hot carrier degradation in deuterated ..."

Cora Salm et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.08.004

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type: Journal Article

metadata version: 2021-10-14

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Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz:
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectron. Reliab. 46(9-11): 1617-1622 (2006)

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