"RF CMOS reliability simulations."

Guido T. Sasse et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Guido T. Sasse, Mustafa Acar, Fred G. Kuper, Jurriaan Schmitz:
RF CMOS reliability simulations. Microelectron. Reliab. 48(8-9): 1581-1585 (2008)

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